SECTION 46: FUNCTIONAL ANALYSIS

Fouad N. Jalbout, Abraham F. Jalbout, Hadi Y. Alkahby

BAYESIAN ECONOMIC COST PLANS I. COMPARISON TO CLASSICAL PLANS

Electron. J. Math. Phys. Sci., 2002, Seminar 1, 1-8

Keyowrds: Bayesian, cost model, comparison, lot size, fraction defective

URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-1-02-abs.html

URL (PDF): http://www.ejmaps.org/sem1/sem1-1-1-02-article.pdf

URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-1-02-article.ps.gz

Abraham F. Jalbout, Hadi Y. Alkahby, Fouad N. Jalbout, Abdulla Darwish

BAYESIAN ECONOMIC COST PLANS II. THE AVERAGE OUTGOING QUALITY

Electron. J. Math. Phys. Sci., 2002, Seminar 1, 9-15

Keyowrds: Inspection Errors, industrial process, Bayesian methods, statistics

URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-9-02-abs.html

URL (PDF): http://www.ejmaps.org/sem1/sem1-1-9-02-article.pdf

URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-9-02-article.ps.gz

Abraham F. Jalbout, Hadi Y. Alkahby, Fouad N. Jalbout, Abdulla Darwish

BAYESIAN ECONOMIC COST PLANS III. THE LOT MEAN RELATIVE TO A QUALITY

CHARACTERISTIC

Electron. J. Math. Phys. Sci., 2002, Seminar 1, 16-24

Keyowrds: Fraction defective, industrial process, Bayesian methods, statistics

URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-16-02-abs.html

URL (PDF): http://www.ejmaps.org/sem1/sem1-1-16-02-article.pdf

URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-16-02-article.ps.gz