SECTION 62: STATISTICS

62P30 (Applications in engineering and industry)

Fouad N. Jalbout, Abraham F. Jalbout, Hadi Y. Alkahby

BAYESIAN ECONOMIC COST PLANS I. COMPARISON TO CLASSICAL PLANS

Electron. J. Math. Phys. Sci., 2002, Seminar 1, 1-8

Keyowrds: Bayesian, cost model, comparison, lot size, fraction defective

URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-1-02-abs.html

URL (PDF): http://www.ejmaps.org/sem1/sem1-1-1-02-article.pdf

URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-1-02-article.ps.gz

Abraham F. Jalbout, Hadi Y. Alkahby, Fouad N. Jalbout, Abdulla Darwish

BAYESIAN ECONOMIC COST PLANS II. THE AVERAGE OUTGOING QUALITY

Electron. J. Math. Phys. Sci., 2002, Seminar 1, 9-15

Keyowrds: Inspection Errors, industrial process, Bayesian methods, statistics

URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-9-02-abs.html

URL (PDF): http://www.ejmaps.org/sem1/sem1-1-9-02-article.pdf

URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-9-02-article.ps.gz

Abraham F. Jalbout, Hadi Y. Alkahby, Fouad N. Jalbout, Abdulla Darwish

BAYESIAN ECONOMIC COST PLANS III. THE LOT MEAN RELATIVE TO A QUALITY

CHARACTERISTIC

Electron. J. Math. Phys. Sci., 2002, Seminar 1, 16-24

Keyowrds: Fraction defective, industrial process, Bayesian methods, statistics

URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-16-02-abs.html

URL (PDF): http://www.ejmaps.org/sem1/sem1-1-16-02-article.pdf

URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-16-02-article.ps.gz