SECTION 62: STATISTICS
62P30 (Applications in
engineering and industry)
Fouad N. Jalbout, Abraham F.
Jalbout, Hadi Y. Alkahby
BAYESIAN ECONOMIC COST PLANS I. COMPARISON TO
CLASSICAL PLANS
Electron. J. Math. Phys.
Sci., 2002, Seminar 1, 1-8
Keyowrds: Bayesian, cost model,
comparison, lot size, fraction defective
URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-1-02-abs.html
URL (PDF): http://www.ejmaps.org/sem1/sem1-1-1-02-article.pdf
URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-1-02-article.ps.gz
Abraham F. Jalbout, Hadi Y.
Alkahby, Fouad N. Jalbout, Abdulla Darwish
BAYESIAN ECONOMIC COST PLANS II. THE AVERAGE
OUTGOING QUALITY
Electron. J. Math. Phys.
Sci., 2002, Seminar 1, 9-15
Keyowrds: Inspection Errors,
industrial process, Bayesian methods, statistics
URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-9-02-abs.html
URL (PDF): http://www.ejmaps.org/sem1/sem1-1-9-02-article.pdf
URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-9-02-article.ps.gz
Abraham F. Jalbout, Hadi Y.
Alkahby, Fouad N. Jalbout, Abdulla Darwish
BAYESIAN ECONOMIC COST PLANS III. THE LOT MEAN
RELATIVE TO A QUALITY
CHARACTERISTIC
Electron. J. Math. Phys.
Sci., 2002, Seminar 1, 16-24
Keyowrds: Fraction defective,
industrial process, Bayesian methods, statistics
URL (ABSTRACT IN HTML): http://www.ejmaps.org/sem1-1-16-02-abs.html
URL (PDF): http://www.ejmaps.org/sem1/sem1-1-16-02-article.pdf
URL (GZPS): http://www.ejmaps.org/sem1/sem1-1-16-02-article.ps.gz
Copyright 2002, Electronic Journal of Mathematical and Physical Sciences, All rights reserved.